HTS 9031
Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof
| Code | Description | Unit | General | Special | Column 2 | Source |
|---|---|---|---|---|---|---|
| 9031.10.00.00 | Machines for balancing mechanical parts | No. | Free | 40% | USITC | |
| 9031.20.00.00 | Test benches | No. | 1.7% | Free (A*,AU,BH,CL,CO,D,E,IL,JO,KR,MA,OM,P,PA,PE,S,SG) | 45% | USITC |
| Other optical instruments and appliances | ||||||
| 9031.41.00 | For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) | Free | 50% | USITC | ||
| 9031.41.00.20 | For inspecting photomasks or reticles used in manufacturing semiconductor devices | No. | Free | 50% | USITC | |
| For inspecting semiconductor wafers or devices | ||||||
| 9031.41.00.40 | For wafers | No. | Free | 50% | USITC | |
| 9031.41.00.60 | Other | No. | Free | 50% | USITC | |
| 9031.49 | Other | USITC | ||||
| 9031.49.10.00 | Profile projectors | No. | Free | 45% | USITC | |
| 9031.49.40.00 | Coordinate-measuring machines | No. | Free | 50% | USITC | |
| 9031.49.70.00 | For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices | No. | Free | 50% | USITC | |
| 9031.49.90.00 | Other | No. | Free | 50% | USITC | |
| 9031.80 | Other instruments, appliances and machines | USITC | ||||
| 9031.80.40.00 | Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles | No. | Free | 40% | USITC | |
| 9031.80.80 | Other | Free | 40% | USITC | ||
| Equipment for testing the characteristics of internal combustion engines | ||||||
| 9031.80.80.60 | For testing electrical characteristics | kg | Free | 40% | USITC | |
| 9031.80.80.70 | Other | kg | Free | 40% | USITC | |
| 9031.80.80.85 | Other | kg | Free | 40% | USITC | |
| 9031.90 | Parts and accessories | USITC | ||||
| 9031.90.21.00 | Of profile projectors | kg | Free | 45% | USITC | |
| Of other optical instruments and appliances, other than test benches | ||||||
| 9031.90.45.00 | Bases and frames for the coordinate-measuring machines of subheading 9031.49.40 | kg | Free | 50% | USITC | |
| 9031.90.54.00 | Of optical instruments and appliances of subheading 9031.41 or 9031.49.70 | kg | Free | 50% | USITC | |
| 9031.90.59.00 | Other | kg | Free | 50% | USITC | |
| Other | ||||||
| 9031.90.70.00 | Of articles of subheading 9031.80.40 | kg | Free | 40% | USITC | |
| 9031.90.91 | Other | Free | 40% | USITC | ||
| 9031.90.91.30 | Of machines for balancing mechanical parts | kg | Free | 40% | USITC | |
| 9031.90.91.60 | Of test benches | kg | Free | 40% | USITC | |
| 9031.90.91.95 | Other | kg | Free | 40% | USITC | |
The table scrolls sideways.
Source: USITC, Harmonized Tariff Schedule of the United States – 2026 HTS Revision 20, effective 28 September 2026. Heading 9031 at USITC
Not shown: the additional duties of Chapter 99 (such as Section 301 and Section 232), anti-dumping and countervailing duties, quotas and the legal notes.
This page is general information, not legal advice and not a classification decision. Tariff texts and rates change: check the publisher's current schedule, and ask the customs authority for a binding ruling where the answer matters.